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Reference
20120001_0084
Vue en microscopie à balayage (MEB) d'un champ de micropiliers de silicium alignés, obtenus en usina
Vue en microscopie à balayage (MEB) d'un champ de micropiliers de silicium alignés, obtenus en usinant un substrat de silicium par un procédé de gravure profonde.
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