Production year
2009
© Emmanuel PERRIN/Univ.Nice-Sophia Antipolis/LEAT/CREMANT/CNRS Images
Reference
20090001_0180
Banc de test sous pointes de composants, puces et circuits microélectroniques. Conception de circuit
Banc de test sous pointes de composants, puces et circuits microélectroniques. Conception de circuits intégrés pour les communications sans fil.
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