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20170023_0048

© Cyril FRESILLON / UMPhy CNRS-Thales / CNRS Images

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20170023_0048

Enceinte de caractérisation à basse température de circuits supraconducteurs

Bruno Marcilhac next to a low-temperature characterisation enclosure for so-called high critical temperature superconducting circuits. These components are used for processing of the microwave signal.

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