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20120001_1107
© Cyril FRESILLON/CNRS Images

Microscope à force atomique (AFM) multimode, Nanoscope V, utilisé pour la caractérisation de surface

Reference

20120001_1107

Production year

2012

Max. size

31.7 x 47.55 cm / 300 dpi

Caption

Microscope à force atomique (AFM) multimode, Nanoscope V, utilisé pour la caractérisation de surfaces de polymères en milieu liquide (ADN, multicouches de polyélectrolytes...).

CNRS Institute(s)

Regional office(s)

Scientific topics

CNRS Images,

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