19980001_0037
© Claude DELHAYE/CNRS Images

Microscope à champ proche STM/AFM (Scanning Tuneling Microscope/Atomic Force Microscope) sous ultra-

Reference

19980001_0037

Production year

1998

Max. size

29.51 x 19.47 cm / 300 dpi

Caption

Microscope à champ proche STM/AFM (Scanning Tuneling Microscope/Atomic Force Microscope) sous ultra-vide. Vue de dessus.

CNRS Institute(s)

Regional office(s)

CNRS Images,

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