Caption
Microscope à champ proche STM/AFM (Scanning Tuneling Microscope/Atomic Force Microscope) sous ultra-vide. Vue de dessus.
© Claude DELHAYE/CNRS Images
Microscope à champ proche STM/AFM (Scanning Tuneling Microscope/Atomic Force Microscope) sous ultra-
Reference
19980001_0037
Production year
1998
Max. size
29.51 x 19.47 cm / 300 dpi
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