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© Cyril FRESILLON / UMPhy CNRS-Thales / CNRS Images
Analyse d'un échantillon par spectrométrie d’électrons photoémis par les rayons X
Max. size27.77 x 41.72 cm / 300 dpi
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Diogo Vaz prepares to analyse a sample by X-ray photoelectron spectroscopy (XPS) in a functional oxide growth cluster. This cluster consists of 2 pulsed laser ablation (PLD - pulsed laser deposition) assemblies, a cathode sputtering assembly and an XPS system for performing in-situ analyses. In PLD, a pulsed laser ablates a target consisting of material that the research scientists wish to deposit in thin layers. The atoms contained in the plasma thus created are deposited on a substrate and form a thin layer.