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20150050_0032
© Cyril FRESILLON / LPCNO / CNRS Images

Mise en place d'un échantillon sur le porte substrat d'un microscope à force atomique

Reference

20150050_0032

Production year

2015

Max. size

41.72 x 27.77 cm / 300 dpi

Caption

Mise en place d'un échantillon sur le porte substrat d'un microscope à force atomique (AFM).

CNRS Institute(s)

Regional office(s)

CNRS Images,

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