Retour au reportage Retour au reportage
20150050_0032

© Cyril FRESILLON / LPCNO / CNRS Images

Reference

20150050_0032

Mise en place d'un échantillon sur le porte substrat d'un microscope à force atomique

Mise en place d'un échantillon sur le porte substrat d'un microscope à force atomique (AFM).

CNRS Institute(s)

Regional office(s)

CNRS Images,

Our work is guided by the way scientists question the world around them and we translate their research into images to help people to understand the world better and to awaken their curiosity and wonderment.