See Photo report
20150050_0013
© Cyril FRESILLON / LPCNO / CNRS Images

Caractérisation de nanomatériaux par microscopie à force atomique (AFM)

Reference

20150050_0013

Production year

2015

Max. size

41.72 x 27.77 cm / 300 dpi

Caption

Caractérisation de nanomatériaux par microscopie à force atomique (AFM).

CNRS Institute(s)

Regional office(s)

Scientific topics

CNRS Images,

Our work is guided by the way scientists question the world around them and we translate their research into images to help people to understand the world better and to awaken their curiosity and wonderment.