Production year
2014
© Cyril FRESILLON / CRM2 / CNRS Images
20140001_0217
Installation et réglage d'un échantillon sur un diffractomètre à rayons X. Cet appareil permet d'étudier la structure de la matière à l'échelle atomique et à basse température (jusqu'à -173 °C).
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2014
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