20130001_0391

© Martin SEISS/CNRS Images

Reference

20130001_0391

Micropipe observed by AFM after the physical vapour transport growth of a SiC crystal

Micropipe observed by AFM after the physical vapour transport growth of a SiC crystal. SiC is widely used in high-temperature/high-voltage semiconductor electronics.

CNRS Institute(s)

Regional office(s)

Scientific topics

CNRS Images,

Our work is guided by the way scientists question the world around them and we translate their research into images to help people to understand the world better and to awaken their curiosity and wonderment.