Production year
2005
© Jérôme CHATIN/CNRS Images
20050001_0345
Microscope à force atomique (AFM) pour l'observation de nanostructures en surface. La résolution de cet appareil est de l'ordre quelques nanomètres. Etude de nanostructures réalisées par croissance épitaxiale (colonnes de semiconducteur d'un diamètre de quelques dizaines de nanomètres, boîtes quantiques).
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2005
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