Caption
Analyse de surface sous ultravide par spectroscopie de photoélectrons (XPS) et rétrodiffusion d'ions lents (LEIS)
© Richard LAMOUREUX/CNRS Images
Analyse de surface sous ultravide par spectroscopie de photoélectrons (XPS) et rétrodiffusion d'ions
Reference
20010001_0274
Production year
2001
Max. size
30 x 20 cm / 300 dpi
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