© Anne-Magali SEYDOUX-GUILLAUME/CNRS Images
Reference
20060001_1005
Image MEB (microscope électronique à balayage) d'une coupe FIB (focused ion beam) de monazite. L'éch
Image MEB (microscope électronique à balayage) d'une coupe FIB (focused ion beam) de monazite. L'échantillon (15 µm x 8 µm) qui mesure environ 100 nm d'épaisseur peut ensuite être analysé au microscope électronique à transmission. Collaboration R. Wirth (GFZ-Potsdam).
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