Production year
2002
© Richard LAMOUREUX/CNRS Images
Reference
20020001_0913
Appareil de diffraction des rayons X INEL à compteur courbe CPS120 (Curved Position Sensitive detect
Appareil de diffraction des rayons X INEL à compteur courbe CPS120 (Curved Position Sensitive detector 120°) équipé d'un dispositif pour l'analyse des couches minces par incidence rasante.
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