Caption
Tests sous pointes de circuits intégrés au LEPSI (Réf. Le Journal du CNRS Juillet-Août 2000).
© Richard LAMOUREUX/CNRS Images
Tests sous pointes de circuits intégrés au LEPSI (Réf. Le Journal du CNRS Juillet-Août 2000).
Reference
20000001_1094
Production year
2000
Max. size
28.03 x 19.47 cm / 300 dpi
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