Production year
2006
© François JANNIN/CNRS Images
20060001_1605
CeCaMA : Centre de Caractérisation des Matériaux Avancés. Appareils de caractérisation chimique et morphologique à l'échelle submicronique. Microsonde à spectrométrie X. L'analyse des rayons X issus d'une excitation par faisceau d'électrons focalisé permet une très bonne analyse quantitative d'un microvolume. Application à l'étude d'un dépôt de TiO2 (dioxyde de titane) obtenu en milieu supercritique.
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2006
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