Production year
1997
© Laurence MEDARD/CNRS Images
19970001_0543
Laser X-UV du LSAI (Orsay) au Laboratoire d'Utilisation des Lasers Intenses (Palaiseau). Exemple d'interférogramme obtenu à la longueur d'onde de 21.2 nm au cours de l'étude de déformation nanométrique de surface sous l'action d'un champ électrique intense. Cette étude propose des applications dans le domaine du pompage optique, de la microlithographie et de la luminescence des cristaux optiques.
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1997
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